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Pushing the Limits of Simple Pipelines for Few-Shot Learning: External Data and Fine-Tuning Make a Difference
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SEEK ID: https://publications.h-its.org/publications/1515
Research Groups: Machine Learning and Artificial Intelligence
Publication type: InProceedings
Book Title: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition
Citation: In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 9068–9077
Date Published: 2022
Registered Mode: imported from a bibtex file
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Created: 10th Oct 2022 at 16:19
Last updated: 5th Mar 2024 at 21:24
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