Characterization Simulation of a Bulk MOSFET in Steady-State with SIPG Method

View Publication
Abstract:
No abstract specified

SEEK ID: https://publications.h-its.org/publications/1202

SEEK ID: https://publications.h-its.org/publications/1202

DOI: 10.1109/ICSICT49897.2020.9278401

Research Groups: Data Mining and Uncertainty Quantification

Publication type: InProceedings

Journal: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

Book Title: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

Publisher: IEEE

Citation: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),pp.1-3,IEEE

Date Published: 3rd Nov 2020

Registered Mode: by DOI

Authors: Jun-Yan Zhu, Chen Song, Vincent Heuveline, Bo Li, Bin-Hong Li, Zheng-Sheng Han, Xin-Yu Liu

help Submitter
Citation
Zhu, J.-Y., Song, C., Heuveline, V., Li, B., Li, B.-H., Han, Z.-S., & Liu, X.-Y. (2020). Characterization Simulation of a Bulk MOSFET in Steady-State with SIPG Method. In 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT). 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT). IEEE. https://doi.org/10.1109/icsict49897.2020.9278401
Activity

Views: 3946

Created: 15th Feb 2021 at 08:08

Last updated: 5th Mar 2024 at 21:24

help Tags

This item has not yet been tagged.

help Attributions

None

Powered by
 (v.1.14.2)
About HITS Publication SEEK | About HITS-Publication-SEEK | Funding and Programmes | Credits
Copyright © 2008 - 2023 The University of Manchester and HITS gGmbH