Characterization Simulation of a Bulk MOSFET in Steady-State with SIPG Method

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SEEK ID: https://publications.h-its.org/publications/1202

SEEK ID: https://publications.h-its.org/publications/1202

DOI: 10.1109/ICSICT49897.2020.9278401

Research Groups: Data Mining and Uncertainty Quantification

Publication type: InProceedings

Journal: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

Book Title: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

Publisher: IEEE

Citation: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),pp.1-3,IEEE

Date Published: 3rd Nov 2020

Registered Mode: by DOI

Authors: Jun-Yan Zhu, Chen Song, Vincent Heuveline, Bo Li, Bin-Hong Li, Zheng-Sheng Han, Xin-Yu Liu

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Zhu, J.-Y., Song, C., Heuveline, V., Li, B., Li, B.-H., Han, Z.-S., & Liu, X.-Y. (2020). Characterization Simulation of a Bulk MOSFET in Steady-State with SIPG Method. In 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) (pp. 1–3). IEEE. https://doi.org/10.1109/icsict49897.2020.9278401
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Created: 15th Feb 2021 at 08:08

Last updated: 5th Mar 2024 at 21:24

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